On yield, fault distributions, and clustering of particles
IBM Journal of Research and Development
Time Series Analysis, Forecasting and Control
Time Series Analysis, Forecasting and Control
IBM Journal of Research and Development
Modeling Defect Spatial Distribution
IEEE Transactions on Computers
Large-area fault clusters and fault tolerance in VLSI circuits
IBM Journal of Research and Development
Small-area fault clusters and fault tolerance in VLSI circuits
IBM Journal of Research and Development
A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits
IEEE Transactions on Computers
On the Effect of Defect Clustering on Test Transparency and IC Test Optimization
IEEE Transactions on Computers
Estimating Burn-In Fall-Out for Redundant Memory
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Exploiting Defect Clustering to Screen Bare Die for Infant Mortality Failures: An Experimental Study
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Predicting Defect-Tolerant Yield in the Embedded Core Context
IEEE Transactions on Computers
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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