On yield, fault distributions, and clustering of particles
IBM Journal of Research and Development
Correlation analysis of particle clusters on integrated circuit wafers
IBM Journal of Research and Development
Large-area fault clusters and fault tolerance in VLSI circuits
IBM Journal of Research and Development
IBM Journal of Research and Development
Large-area fault clusters and fault tolerance in VLSI circuits
IBM Journal of Research and Development
Synergistic Fault-Tolerance for Memory Chips
IEEE Transactions on Computers
A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits
IEEE Transactions on Computers
Yield modeling and BEOL fundamentals
Proceedings of the 2001 international workshop on System-level interconnect prediction
Predicting Defect-Tolerant Yield in the Embedded Core Context
IEEE Transactions on Computers
Wafer-level modular testing of core-based SoCs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A statistical study of defect maps of large area VLSI IC's
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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