Exploiting Defect Clustering to Screen Bare Die for Infant Mortality Failures: An Experimental Study

Authors:
David R. Lakin II;Adit D. Singh
Affiliations:
-;-
Venue:
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Year:
1999

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Abstract

We present the first experimental results toestablish that a binning strategy based ondefect clustering can be used to screen baredie for early life failures. The data for thisstudy comes from the SEMATECH1test methods experiment.