Binning for IC Quality: Experimental Studies on the SEMATECH Data

Authors:
Adit D. Singh;Davod R. Lakin, II;Gaurav Sinha;Phil Nigh
Affiliations:
-;-;-;-
Venue:
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
Year:
1998

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Abstract