MINVDD Testing for Weak CMOS ICs

Authors:
Chao-Wen Tseng;Ray Chen;Edward J. McCluskey;Phil Nigh
Affiliations:
-;-;-;-
Venue:
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Year:
2001

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Abstract

A weak chip is one that contains flaws - defects that do not interfere with correct circuit operation at normal conditions but may cause intermittent or early-life failures. MINVDD testing can detect weak CMOS chips. The minvdd of a chip is the minimum supply voltage value at which a chip can function correctly. It can be used to differentiate between good chips and weak chips. In the first part of this paper, we will study several types of flaws to demonstrate the effectiveness of MINVDD testing. Experimental results show that MINVDD testing is as effective as VLV testing for screening out burn-in rejects. In the second part of this paper, we propose test conditions for low voltage testing, including test voltage, test timing and test sets. Experimental results are presented to validate our proposal.