IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Graphical IDDQ signatures reduce defect level and yield loss
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Effectiveness of the clustering based approach in detecting devices with abnormal IDDQ values is evaluated using data from the SEMATECH test methods experiment. The results from clustering are compared to the results obtained on actual silicon during the SEMATECH study. The differences between the results obtained in each case are analyzed. The clustering approach is also compared to two common IDDQ test techniques, the single-threshold approach and the delta-IDDQ approach, and the results are presented.