Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs

  • Authors:
  • A. Keshavarzi;S. Ma;S. Narendra;B. Bloechel;K. Mistry;T. Ghani;S. Borkar;V. De

  • Affiliations:
  • Microprocessor Research Labs, Intel Corporation, Hillsboro, OR;Microprocessor Research Labs, Intel Corporation, Hillsboro, OR;Microprocessor Research Labs, Intel Corporation, Hillsboro, OR;Microprocessor Research Labs, Intel Corporation, Hillsboro, OR;Portland Technology Development, Intel Corporation, Hillsboro, OR;Portland Technology Development, Intel Corporation, Hillsboro, OR;Microprocessor Research Labs, Intel Corporation, Hillsboro, OR;Microprocessor Research Labs, Intel Corporation, Hillsboro, OR

  • Venue:
  • ISLPED '01 Proceedings of the 2001 international symposium on Low power electronics and design
  • Year:
  • 2001

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Abstract