Parameter variations and impact on circuits and microarchitecture

  • Authors:
  • Shekhar Borkar;Tanay Karnik;Siva Narendra;Jim Tschanz;Ali Keshavarzi;Vivek De

  • Affiliations:
  • Intel Labs, Hillsboro, OR;Intel Labs, Hillsboro, OR;Intel Labs, Hillsboro, OR;Intel Labs, Hillsboro, OR;Intel Labs, Hillsboro, OR;Intel Labs, Hillsboro, OR

  • Venue:
  • Proceedings of the 40th annual Design Automation Conference
  • Year:
  • 2003

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Abstract

Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented.