Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Parametric yield estimation considering leakage variability
Proceedings of the 41st annual Design Automation Conference
Full-chip analysis of leakage power under process variations, including spatial correlations
Proceedings of the 42nd annual Design Automation Conference
Leakage minimization of nano-scale circuits in the presence of systematic and random variations
Proceedings of the 42nd annual Design Automation Conference
Robust extraction of spatial correlation
Proceedings of the 2006 international symposium on Physical design
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions
Proceedings of the 43rd annual Design Automation Conference
Statistical analysis of full-chip leakage power considering junction tunneling leakage
Proceedings of the 44th annual Design Automation Conference
Chip level statistical leakage power estimation using generalized extreme value distribution
PATMOS'11 Proceedings of the 21st international conference on Integrated circuit and system design: power and timing modeling, optimization, and simulation
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Nominal power estimation is quick but gives minimal information. Statistical power analysis can provide information on yield, chip robustness, etc., but current methods are unnecessarily slow and complex. This is primarily because existing leakage-power models, which model leakage power as lognormal distribution and calculate chip leakage power based on Wilkinson's approach, are not directly additive. Hence, for each incremental change of the circuit, the covariances between each pair of circuit elements need to be recalculated, which is inefficient. In this paper, we proposed a simple additive polynomial leakage-variation model. With additivity, we can calculate chip leakage power and leakage power after incremental change very efficiently. Experimental results show that our method is five times faster than the existing Wilkinson's approach while having no accuracy loss in mean estimation and about 1% accuracy loss in standard-deviation and 99%-percentile-point estimations.