Stochastic finite elements: a spectral approach
Stochastic finite elements: a spectral approach
Gate sizing for constrained delay/power/area optimization
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special issue on low power electronics and design
Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Parametric yield estimation considering leakage variability
Proceedings of the 41st annual Design Automation Conference
Statistical Timing Analysis Considering Spatial Correlations using a Single Pert-Like Traversal
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Modeling Within-Die Spatial Correlation Effects for Process-Design Co-Optimization
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
An efficient algorithm for statistical minimization of total power under timing yield constraints
Proceedings of the 42nd annual Design Automation Conference
Robust gate sizing by geometric programming
Proceedings of the 42nd annual Design Automation Conference
Leakage minimization of nano-scale circuits in the presence of systematic and random variations
Proceedings of the 42nd annual Design Automation Conference
Proceedings of the 42nd annual Design Automation Conference
LOTUS: Leakage Optimization under Timing Uncertainty for Standard-cell designs
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
A unified framework for statistical timing analysis with coupling and multiple input switching
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Gate sizing using incremental parameterized statistical timing analysis
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
A framework for statistical timing analysis using non-linear delay and slew models
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
A general framework for spatial correlation modeling in VLSI design
Proceedings of the 44th annual Design Automation Conference
Statistical performance modeling and optimization
Foundations and Trends in Electronic Design Automation
Variations, margins, and statistics
Proceedings of the 2008 international symposium on Physical design
Within-die process variations: how accurately can they be statistically modeled?
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
Proceedings of the conference on Design, automation and test in Europe
Parametric yield management for 3D ICs: Models and strategies for improvement
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Stochastic thermal simulation considering spatial correlated within-die process variations
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
Reducing functional unit power consumption and its variation using leakage sensors
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
ViPZonE: OS-level memory variability-driven physical address zoning for energy savings
Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
Towards variation-aware system-level power estimation of DRAMs: an empirical approach
Proceedings of the 50th Annual Design Automation Conference
| Hi-index | 0.00 |
This paper proposes the use of Karhunen-Loève Expansion (KLE) for accurate and efficient modeling of intra-die correlations in the semiconductor manufacturing process. We demonstrate that the KLE provides a significantly more accurate representation of the underlying stochastic process compared to the traditional approach of dividing the layout into grids and applying Principal Component Analysis (PCA). By comparing the results of leakage analysis using both KLE and the existing approaches, we show that using KLE can provide up to 4-5x reduction in the variability space (number of random variables) while maintaining the same accuracy. We also propose an efficient leakage minimization algorithm that maximizes the leakage yield while satisfying probabilistic constraints on the delay.