Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Parametric yield estimation considering leakage variability
Proceedings of the 41st annual Design Automation Conference
Full-chip analysis of leakage power under process variations, including spatial correlations
Proceedings of the 42nd annual Design Automation Conference
Proceedings of the 42nd annual Design Automation Conference
Analysis and mitigation of variability in subthreshold design
ISLPED '05 Proceedings of the 2005 international symposium on Low power electronics and design
Proceedings of the 43rd annual Design Automation Conference
Thermal Characterization of Test Techniques for FinFET and 3D Integrated Circuits
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Design space exploration of FinFET cache
ACM Journal on Emerging Technologies in Computing Systems (JETC)
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This paper presents a statistical leakage estimation method for FinFET devices considering the unique width quantization property. Monte Carlo simulations show that the conventional approach underestimates the average leakage current of FinFET devices by as much as 43% while the proposed approach gives a precise estimation with an error less than 5%. Design example on subthreshold circuits shows the effectiveness of the proposed method.