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Proceedings of the 2006 international symposium on Low power electronics and design
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Utilizing reverse short-channel effect for optimal subthreshold circuit design
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Proceedings of the 13th international symposium on Low power electronics and design
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Proceedings of the 17th IEEE/ACM international symposium on Low-power electronics and design
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Ultra-low-power signaling challenges for subthreshold global interconnects
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Proceedings of the 49th Annual Design Automation Conference
Process variation in near-threshold wide SIMD architectures
Proceedings of the 49th Annual Design Automation Conference
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Integration, the VLSI Journal
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Subthreshold circuit design is a compelling method for ultra-low power applications. However, subthreshold designs show dramatically increased sensitivity to process variations due to the exponential relationship of subthreshold drive current with V th variation. In this paper, we present an analysis of subthreshold energy efficiency considering process variation, and propose methods to mitigate its impact. We show that, unlike superthreshold circuits, random dopant fluctuation is the dominant component of variation in subthreshold operation. We investigate how this variability can be ameliorated with proper circuit sizing and choice of circuit logic depth. We then present a statistical analysis of the energy efficiency of subthreshold circuits considering process variations. We show that the energy optimal supply voltage increases due to process variations and study its dependence on circuit parameters. We verify our analytical models against Monte Carlo SPICE simulations and show that they accurately predict the minimum energy and energy optimal supply voltage. Finally, we use the developed statistical energy model to determine the optimal pipelining depth in subthreshold designs