Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Temperature-aware microarchitecture
Proceedings of the 30th annual international symposium on Computer architecture
ACM SIGMETRICS Performance Evaluation Review - Special issue on tools for computer architecture research
Variability and energy awareness: a microarchitecture-level perspective
Proceedings of the 42nd annual Design Automation Conference
Proceedings of the 42nd annual Design Automation Conference
Mitigating Parameter Variation with Dynamic Fine-Grain Body Biasing
Proceedings of the 40th Annual IEEE/ACM International Symposium on Microarchitecture
On-Chip Process Variation Detection Using Slew-Rate Monitoring Circuit
VLSID '08 Proceedings of the 21st International Conference on VLSI Design
Mitigating the impact of variability on chip-multiprocessor power and performance
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Estimation of FMAX and ISB in microprocessors
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Modeling symmetrical independent gate FinFET using predictive technology model
Proceedings of the 23rd ACM international conference on Great lakes symposium on VLSI
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Body biasing has been demonstrated to be effective in addressing process variability in a variety of simple chip designs. Modern microprocessors implement dynamic voltage/frequency scaling, with significant implications for the use of body biasing. For a 16-core chip-multiprocessor implemented in a high-performance 22 nm technology, the body biases required to meet the frequency target at the lowest and highest voltage/frequency levels differ by an average of 0.7 V, implying that per-level biases are required to fully leverage body biasing. The need to make abrupt changes in the bias voltages when the voltage/frequency level changes affects the cost/benefit analysis of body biasing schemes. It is demonstrated that computing unique body biases for each voltage/frequency level at chip power-on offers the best tradeoff among a variety of methods in terms of area, performance, and power.