Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Process Variations and Process-Tolerant Design
VLSID '07 Proceedings of the 20th International Conference on VLSI Design held jointly with 6th International Conference: Embedded Systems
4- and 6-GS/s 4-bit frequency-translating hybrid ADCs in 90-nm CMOS
Analog Integrated Circuits and Signal Processing
Analog Integrated Circuits and Signal Processing
Design of a parallel low power flash A/D converter for the sub-sampling IR-UWB receiver
Analog Integrated Circuits and Signal Processing
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A 2.5 GS/s flash ADC, fabricated in 90 nm CMOS utilizes comparator redundancy to avoid traditional power, speed and accuracy trade-offs. The redundancy removes the need to control comparator offsets, allowing the large process-variation induced mismatch of small devices in nanometer technologies. This enables the use of small-sized, ultra-low-power comparators with clock-gating capabilities in order to reduce the power dissipation. The chosen calibration method enables an overall low-power solution and measurement results show that the ADC dissipates 30 mW at 1.2 V. With 63 comparators, the ADC achieves 3.9 effective number of bits.