Variation-tolerant circuits: circuit solutions and techniques

Authors:
Jim Tschanz;Keith Bowman;Vivek De
Affiliations:
Intel Corporation, Hillsboro, OR;Intel Corporation, Hillsboro, OR;Intel Corporation, Hillsboro, OR
Venue:
Proceedings of the 42nd annual Design Automation Conference
Year:
2005

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Abstract

Die-to-die and within-die variations impact the frequency and power of fabricated dies, affecting functionality, performance, and revenue. Variation-tolerant circuits and post-silicon tuning techniques are important for minimizing the impacts of these variations. This paper describes several circuit techniques that can be employed to ensure efficient circuit operation in the presence of ever-increasing variations.