VAIL: variation-aware issue logic and performance binning for processor yield and profit improvement

  • Authors:
  • Somnath Paul;Swarup Bhunia

  • Affiliations:
  • Case Western Reserve University, Cleveland, USA;Case Western Reserve University, Cleveland, USA

  • Venue:
  • Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design
  • Year:
  • 2010

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Abstract

With increasing parameter variations, functional units (FUs) in a chip experience considerable local variations in maximum operating frequency. Effect of such within-die variations in a superscalar processor if addressed by worst-case frequency assignment, results in overly pessimistic yield in high-frequency bins. In this paper, we propose VAIL - a novel low-overhead instruction scheduling strategy that assigns best-case frequency by issuing the narrow-width (NW) operations to slower units. This exploits the abundance of NW operations (70%) in a typical program and the fact that the critical path in FUs are not activated for these operations. Compared to existing vari-cycle approach, the proposed scheme demonstrates a large improvement in yield (~ 27% at highest performance bin) and profit (10-15%) for a set of benchmark applications. It also improves the thermal profile for the FUs. Finally, it provides large opportunistic power saving (~ 43%) in the slow units using supply gating of inactive bit-slices.