A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
Proceedings of the 40th annual Design Automation Conference
Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Statistical static timing analysis: how simple can we get?
Proceedings of the 42nd annual Design Automation Conference
A path-based methodology for post-silicon timing validation
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Statistical characterization of library timing performance
PATMOS'06 Proceedings of the 16th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
Temperature- and Voltage-Aware Timing Analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
PATMOS'09 Proceedings of the 19th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
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The increase of within-die variations and design margins is creating a need for statistical design methods. This paper proposes a simple statistical timing analysis method considering the lot to lot process shifts occurring during production. This method is first validated for 90nm and 65nm processes. Finally, this statistical timing analysis is applied on basic ring oscillators to evaluate the timing margins introduced at the design level by the traditional corner based approach.