The nature of statistical learning theory
The nature of statistical learning theory
An introduction to support Vector Machines: and other kernel-based learning methods
An introduction to support Vector Machines: and other kernel-based learning methods
Detailed design and evaluation of redundant multithreading alternatives
ISCA '02 Proceedings of the 29th annual international symposium on Computer architecture
Process Variations and their Impact on Circuit Operation
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic
DSN '02 Proceedings of the 2002 International Conference on Dependable Systems and Networks
Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Novel sizing algorithm for yield improvement under process variation in nanometer technology
Proceedings of the 41st annual Design Automation Conference
Commercial Fault Tolerance: A Tale of Two Systems
IEEE Transactions on Dependable and Secure Computing
Closed-Form Simulation and Robustness Models for SEU-Tolerant Design
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
A soft error rate analysis (SERA) methodology
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
SEAT-LA: A Soft Error Analysis Tool for Combinational Logic
VLSID '06 Proceedings of the 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design
FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
An efficient static algorithm for computing the soft error rates of combinational circuits
Proceedings of the conference on Design, automation and test in Europe: Proceedings
MARS-C: modeling and reduction of soft errors in combinational circuits
Proceedings of the 43rd annual Design Automation Conference
Variation Impact on SER of Combinational Circuits
ISQED '07 Proceedings of the 8th International Symposium on Quality Electronic Design
Design for Resilience to Soft Errors and Variations
IOLTS '07 Proceedings of the 13th IEEE International On-Line Testing Symposium
A fast, analytical estimator for the SEU-induced pulse width in combinational designs
Proceedings of the 45th annual Design Automation Conference
On the role of timing masking in reliable logic circuit design
Proceedings of the 45th annual Design Automation Conference
Process variability-aware transient fault modeling and analysis
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
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This article re-examines the soft error effect caused by radiation-induced particles beyond the deep submicron regime. Considering the impact of process variations, voltage pulse widths of transient faults are found no longer monotonically diminishing after propagation, as they were formerly. As a result, the soft error rates in scaled electronic designs escape traditional static analysis and are seriously underestimated. In this article we formulate the statistical soft error rate (SSER) problem and present two frameworks to cope with the aforementioned sophisticated issues. The table-lookup framework captures the change of transient-fault distributions implicitly by using a Monte-Carlo approach, whereas the SVR-learning framework does the task explicitly by using statistical learning theory. Experimental results show that both frameworks can more accurately estimate SERs than static approaches do. Meanwhile, the SVR-learning framework outperforms the table-lookup framework in both SER accuracy and runtime.