Globally optimized robust systems to overcome scaled CMOS reliability challenges
Proceedings of the conference on Design, automation and test in Europe
Resilient circuits: enabling energy-efficient performance and reliability
Proceedings of the 2009 International Conference on Computer-Aided Design
On soft error rate analysis of scaled CMOS designs: a statistical perspective
Proceedings of the 2009 International Conference on Computer-Aided Design
Statistical Soft Error Rate (SSER) Analysis for Scaled CMOS Designs
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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This paper presents Adaptive Variation-and-Error- Resilient Agent (AVERA), an approach to address the challenge of designing reliable systems in the presence of soft errors and variations. AVERA extends our previous Built-In Soft Error Resilience (BISER) approach by adding additional capabilities to support process variation diagnosis, degradation detection, and system adaptation, besides soft error correction. We also discuss open challenges for building variation-and-error-resilient systems.