The nature of statistical learning theory
The nature of statistical learning theory
An introduction to support Vector Machines: and other kernel-based learning methods
An introduction to support Vector Machines: and other kernel-based learning methods
Detailed design and evaluation of redundant multithreading alternatives
ISCA '02 Proceedings of the 29th annual international symposium on Computer architecture
Process Variations and their Impact on Circuit Operation
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic
DSN '02 Proceedings of the 2002 International Conference on Dependable Systems and Networks
Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Commercial Fault Tolerance: A Tale of Two Systems
IEEE Transactions on Dependable and Secure Computing
Closed-Form Simulation and Robustness Models for SEU-Tolerant Design
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
A soft error rate analysis (SERA) methodology
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
SEAT-LA: A Soft Error Analysis Tool for Combinational Logic
VLSID '06 Proceedings of the 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design
FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
An efficient static algorithm for computing the soft error rates of combinational circuits
Proceedings of the conference on Design, automation and test in Europe: Proceedings
MARS-C: modeling and reduction of soft errors in combinational circuits
Proceedings of the 43rd annual Design Automation Conference
Variation Impact on SER of Combinational Circuits
ISQED '07 Proceedings of the 8th International Symposium on Quality Electronic Design
Design for Resilience to Soft Errors and Variations
IOLTS '07 Proceedings of the 13th IEEE International On-Line Testing Symposium
A fast, analytical estimator for the SEU-induced pulse width in combinational designs
Proceedings of the 45th annual Design Automation Conference
On the role of timing masking in reliable logic circuit design
Proceedings of the 45th annual Design Automation Conference
Process variability-aware transient fault modeling and analysis
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
Formal modeling and reasoning for reliability analysis
Proceedings of the 47th Design Automation Conference
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This paper re-examines the soft error effect caused by cosmic radiation in sub 90nm technologies. Considering the impact of process variation, a number of statistical natures of transient faults are found more sophisticated than their static ones. We apply the state-of-the-art statistical learning algorithm to tackle the complexity of these natures and build compact yet accurate generation and propagation models for transient fault distributions. A statistical analysis framework for soft error rate (SER) is also proposed on the basis of these models. Experimental results show that the proposed framework can obtain improved SER estimation compared to the static approaches.