IVF: characterizing the vulnerability of microprocessor structures to intermittent faults

  • Authors:

  • Songjun Pan;Yu Hu;Xiaowei Li

  • Affiliations:

  • Institute of Computing Technology, Chinese Academy of Sciences, Beijing, P.R. China and Graduate University of Chinese Academy of Sciences, Beijing, P.R. China;Institute of Computing Technology, Chinese Academy of Sciences, Beijing, P.R. China;Institute of Computing Technology, Chinese Academy of Sciences, Beijing, P.R. China

  • Venue:
  • Proceedings of the Conference on Design, Automation and Test in Europe
  • Year:
  • 2010

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Abstract

With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively characterizing the vulnerability of microprocessor structures to intermittent faults at early design stage is significantly helpful to balance system performance and reliability. Prior researches have proposed several metrics to characterize the vulnerability of microprocessor structures to soft errors and permanent faults, however, the vulnerability of these structures to intermittent faults are still rarely considered. In this work, we propose a metric intermittent vulnerability factor (IVF) to characterize the vulnerability of microprocessor structures to intermittent faults. A structure's IVF is the probability an intermittent fault in that structure causes an external visible error. We instrument a cycle-accurate execution-driven simulator Sim-Alpha to compute IVFs for reorder buffer and register file. Experimental results show that the IVF of reorder buffer is much higher than that of register file. Besides, IVF varies significantly across different structures and workloads, which implies partial protection to the most vulnerable structures to improve system reliability with less overhead.