Trends and Challenges in VLSI Circuit Reliability

Authors:
Cristian Constantinescu
Affiliations:
-
Venue:
IEEE Micro
Year:
2003

Citing 9
Cited 80

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Abstract

Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.