Increasing superscalar performance through multistreaming
PACT '95 Proceedings of the IFIP WG10.3 working conference on Parallel architectures and compilation techniques
Transient fault detection via simultaneous multithreading
Proceedings of the 27th annual international symposium on Computer architecture
A physical design tool for built-in self-repairable RAMs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Computer
The MIPS R10000 Superscalar Microprocessor
IEEE Micro
AR-SMT: A Microarchitectural Approach to Fault Tolerance in Microprocessors
FTCS '99 Proceedings of the Twenty-Ninth Annual International Symposium on Fault-Tolerant Computing
Accurate Estimation of Soft Error Rate (SER) in VLSI Circuits
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes
IEEE Transactions on Dependable and Secure Computing
The Soft Error Problem: An Architectural Perspective
HPCA '05 Proceedings of the 11th International Symposium on High-Performance Computer Architecture
Chip Multithreading: Opportunities and Challenges
HPCA '05 Proceedings of the 11th International Symposium on High-Performance Computer Architecture
Analytical Semi-Empirical Model for SER Sensitivity Estimation of Deep-Submicron CMOS Circuits
IOLTS '05 Proceedings of the 11th IEEE International On-Line Testing Symposium
Error-tolerance memory Microarchitecture via Dynamic Multithreading
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Combinational Logic Soft Error Analysis and Protection
IOLTS '06 Proceedings of the 12th IEEE International Symposium on On-Line Testing
Thread-associative memory for multicore and multithreaded computing
Proceedings of the 2006 international symposium on Low power electronics and design
Optimal codes for single-error correction, double-adjacent-error detection
IEEE Transactions on Information Theory
Gate sizing to radiation harden combinational logic
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Soft-Error-Rate-Analysis (SERA) Methodology
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Hi-index | 0.00 |
Chip multithreaded computing is exposed to the dual challenges of increasing system complexity and error sensitivity. It is critical to develop effective solutions that achieve better error tolerance without inducing performance degradation. In this paper, we propose a new error-tolerant memory design based on a unique computing phenomenon referred to as the dynamic multithreading redundancy (DMR). The proposed technique exploits the interplay between the concurrent threads for runtime error control. We also present two DMR enhancements, immediate write-back and self-recovery, to address the error accumulation effect. A multithreaded register file was implemented to demonstrate the proposed DMR technique. Simulation results on the SPEC CPU2000 benchmarks demonstrate significant overhead reduction in performance and energy efficiency related to error recovery. In addition, the proposed technique features good scalability with respect to the instruction-level and thread-level parallelism for next-generation processor design, where the soft error problem is expected to get worse due to technology scaling and architecture-affecting trends.