Combinational Logic Soft Error Analysis and Protection

Authors:
Andre K. Nieuwland;Samir Jasarevic;Goran Jerin
Affiliations:
Philips Research Eindhoven, Netherlands;Philips Semiconductors, UK;Lund University, Sweden
Venue:
IOLTS '06 Proceedings of the 12th IEEE International Symposium on On-Line Testing
Year:
2006

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Abstract

Like other silicon integrated circuit (IC) domains, the smart card market is very competitive and main actors are constantly trying to design the cheapest and safest circuits to ensure their consumers' satisfaction. These specificities lead smart cards ...