Dynamic binary control-flow errors detection

Authors:
Edson Borin;Cheng Wang;Youfeng Wu;Guido Araujo
Affiliations:
Programming Systems Lab, Intel Corporation, Santa Clara, CA;Programming Systems Lab, Intel Corporation, Santa Clara, CA;Programming Systems Lab, Intel Corporation, Santa Clara, CA;Institute of Computing, UNICAMP, Campinas, SP, Brazil
Venue:
ACM SIGARCH Computer Architecture News - Special issue on the 2005 workshop on binary instrumentation and application
Year:
2005

Citing 6
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Abstract

Shrinking microprocessor feature size will increase the soft-error rates to unacceptable levels in the near future. While reliable systems typically employ hardware techniques to address soft-errors, software techniques can provide a less expensive and more flexible alternative. This paper presents a control-flow error classification and proposes new software based control-flow error detection techniques. The new techniques are better than the previous ones in the sense that they detect errors in all the branch-error categories. We also compare the performance of our new techniques with that of the previous ones using our dynamic binary translator.