IBM experiments in soft fails in computer electronics (1978–1994)
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Accelerated testing for cosmic soft-error rate
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Modeling the cosmic-ray-induced soft-error rate in integrated circuits: an overview
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Soft-error Monte Carlo modeling program, SEMM
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
IBM experiments in soft fails in computer electronics (1978–1994)
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Terrestrial cosmic ray intensities
IBM Journal of Research and Development
Using Memory Errors to Attack a Virtual Machine
SP '03 Proceedings of the 2003 IEEE Symposium on Security and Privacy
IEEE Transactions on Computers
Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes
IEEE Transactions on Dependable and Secure Computing
Design and Evaluation of Hybrid Fault-Detection Systems
Proceedings of the 32nd annual international symposium on Computer Architecture
Efficient computation of the characteristic polynomial
Proceedings of the 2005 international symposium on Symbolic and algebraic computation
Software-controlled fault tolerance
ACM Transactions on Architecture and Code Optimization (TACO)
Software-Based Transparent and Comprehensive Control-Flow Error Detection
Proceedings of the International Symposium on Code Generation and Optimization
Efficient polynomial time algorithms computing industrial-strength primitive roots
Information Processing Letters
Dynamic binary control-flow errors detection
ACM SIGARCH Computer Architecture News - Special issue on the 2005 workshop on binary instrumentation and application
Static typing for a faulty lambda calculus
Proceedings of the eleventh ACM SIGPLAN international conference on Functional programming
Fault-tolerant typed assembly language
Proceedings of the 2007 ACM SIGPLAN conference on Programming language design and implementation
An empirical study of memory hardware errors in a server farm
HotDep'07 Proceedings of the 3rd workshop on on Hot Topics in System Dependability
A memory soft error measurement on production systems
ATC'07 2007 USENIX Annual Technical Conference on Proceedings of the USENIX Annual Technical Conference
Reasoning about Control Flow in the Presence of Transient Faults
SAS '08 Proceedings of the 15th international symposium on Static Analysis
System RAS implications of DRAM soft errors
IBM Journal of Research and Development
A General Class of M-Spotty Byte Error Control Codes
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
DRAM errors in the wild: a large-scale field study
Proceedings of the eleventh international joint conference on Measurement and modeling of computer systems
RAS strategy for IBM S/390 G5 and G6
IBM Journal of Research and Development
Efficient polynomial time algorithms computing industrial-strength primitive roots
Information Processing Letters
End-to-end data integrity for file systems: a ZFS case study
FAST'10 Proceedings of the 8th USENIX conference on File and storage technologies
A realistic evaluation of memory hardware errors and software system susceptibility
USENIXATC'10 Proceedings of the 2010 USENIX conference on USENIX annual technical conference
DRAM errors in the wild: a large-scale field study
Communications of the ACM
HotDep'10 Proceedings of the Sixth international conference on Hot topics in system dependability
Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on the 2002 international symposium on low-power electronics and design (ISLPED)
Proceedings of the 24th symposium on Integrated circuits and systems design
Exploring the Limitations of Software-based Techniques in SEE Fault Coverage
Journal of Electronic Testing: Theory and Applications
ASPLOS XVII Proceedings of the seventeenth international conference on Architectural Support for Programming Languages and Operating Systems
Runtime asynchronous fault tolerance via speculation
Proceedings of the Tenth International Symposium on Code Generation and Optimization
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