IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Accelerated testing for cosmic soft-error rate
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Soft-error Monte Carlo modeling program, SEMM
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Critical charge calculations for a bipolar SRAM array
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
IBM experiments in soft fails in computer electronics (1978–1994)
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Field testing for cosmic ray soft errors in semiconductor memories
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Accelerated testing for cosmic soft-error rate
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Critical charge calculations for a bipolar SRAM array
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Analyzing heap error behavior in embedded JVM environments
Proceedings of the 2nd IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
A Case for Clumsy Packet Processors
Proceedings of the 37th annual IEEE/ACM International Symposium on Microarchitecture
Increasing Register File Immunity to Transient Errors
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
SBCCI '05 Proceedings of the 18th annual symposium on Integrated circuits and system design
Single event transients in combinatorial circuits
SBCCI '05 Proceedings of the 18th annual symposium on Integrated circuits and system design
Single event transients in dynamic logic
SBCCI '06 Proceedings of the 19th annual symposium on Integrated circuits and systems design
Majority Logic Mapping for Soft Error Dependability
Journal of Electronic Testing: Theory and Applications
Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors
Journal of Electronic Testing: Theory and Applications
Soft error rate computation in early design stages using boolean satisfiability
Proceedings of the 19th ACM Great Lakes symposium on VLSI
Architecture Design for Soft Errors
Architecture Design for Soft Errors
Design sensitivity of single event transients in scaled logic circuits
Proceedings of the 48th Design Automation Conference
Memory space conscious loop iteration duplication for reliable execution
SAS'05 Proceedings of the 12th international conference on Static Analysis
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