FINE: A Fault Injection and Monitoring Environment for Tracing the UNIX System Behavior Under Faults
IEEE Transactions on Software Engineering - Special issue on software reliability
Shade: a fast instruction-set simulator for execution profiling
SIGMETRICS '94 Proceedings of the 1994 ACM SIGMETRICS conference on Measurement and modeling of computer systems
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Modeling the cosmic-ray-induced soft-error rate in integrated circuits: an overview
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Performance and reliability analysis of computer systems: an example-based approach using the SHARPE software package
Fault-Containment in Cache Memories for TMR Redundant Processor Systems
IEEE Transactions on Computers
Probability and statistics with reliability, queuing and computer science applications
Probability and statistics with reliability, queuing and computer science applications
Increasing relevance of memory hardware errors: a case for recoverable programming models
EW 9 Proceedings of the 9th workshop on ACM SIGOPS European workshop: beyond the PC: new challenges for the operating system
A Fault Tolerant Approach to Microprocessor Design
DSN '01 Proceedings of the 2001 International Conference on Dependable Systems and Networks (formerly: FTCS)
A Just-in-Time Compiler for Memory-Constrained Low-Power Devices
Proceedings of the 2nd Java Virtual Machine Research and Technology Symposium
sEc: A Portable Interpreter Optimizing Technique for Embedded Java Virtual Machine
Proceedings of the 2nd Java Virtual Machine Research and Technology Symposium
Analyzing Soft Errors in Leakage Optimized SRAM Design
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
JVM susceptibility to memory errors
JVM'01 Proceedings of the 2001 Symposium on JavaTM Virtual Machine Research and Technology Symposium - Volume 1
Improving java virtual machine reliability for memory-constrained embedded systems
Proceedings of the 42nd annual Design Automation Conference
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Recent studies have shown that transient hardware errors caused by external factors such as alpha particles and cosmic ray strikes can be responsible for a large percentage of system down-time. Denser processing technologies, increasing clock speeds, and low supply voltages used in embedded systems can worsen this problem. In many embedded environments, one may not want to provision extensive error protection in hardware because of (i) form-factor or power consumption limitations, and/or (ii) to keep costs low. Also, the mismatch between the hardware protection granularity and the field access granularity can lead to false alarms and error cancellations. Consequently, software-based approaches to identify and possibly rectify these errors seem to be promising. Towards this goal, this paper specifically looks to enhance the software's ability to detect heap memory errors in a Java-based embedded system.