IBM experiments in soft fails in computer electronics (1978–1994)
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Field testing for cosmic ray soft errors in semiconductor memories
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Accelerated testing for cosmic soft-error rate
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
IBM experiments in soft fails in computer electronics (1978–1994)
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Field testing for cosmic ray soft errors in semiconductor memories
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Accelerated testing for cosmic soft-error rate
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Modeling the cosmic-ray-induced soft-error rate in integrated circuits: an overview
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Soft-error Monte Carlo modeling program, SEMM
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Critical charge calculations for a bipolar SRAM array
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
DIVA: a reliable substrate for deep submicron microarchitecture design
Proceedings of the 32nd annual ACM/IEEE international symposium on Microarchitecture
Proceedings of the 33rd annual ACM/IEEE international symposium on Microarchitecture
Increasing relevance of memory hardware errors: a case for recoverable programming models
EW 9 Proceedings of the 9th workshop on ACM SIGOPS European workshop: beyond the PC: new challenges for the operating system
Failure Mode Analysis of CORBA Service Implementations
Middleware '01 Proceedings of the IFIP/ACM International Conference on Distributed Systems Platforms Heidelberg
A Fault Tolerant Approach to Microprocessor Design
DSN '01 Proceedings of the 2001 International Conference on Dependable Systems and Networks (formerly: FTCS)
Analyzing Soft Errors in Leakage Optimized SRAM Design
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
Proceedings of the 36th annual IEEE/ACM International Symposium on Microarchitecture
Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on low power
Proceedings of the 31st annual international symposium on Computer architecture
Soft error and energy consumption interactions: a data cache perspective
Proceedings of the 2004 international symposium on Low power electronics and design
Analyzing heap error behavior in embedded JVM environments
Proceedings of the 2nd IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes
IEEE Transactions on Dependable and Secure Computing
Soft error rate estimation and mitigation for SRAM-based FPGAs
Proceedings of the 2005 ACM/SIGDA 13th international symposium on Field-programmable gate arrays
Gate-Level Mitigation Techniques for Neutron-Induced Soft Error Rate
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Assessing Fault Sensitivity in MPI Applications
Proceedings of the 2004 ACM/IEEE conference on Supercomputing
Improving java virtual machine reliability for memory-constrained embedded systems
Proceedings of the 42nd annual Design Automation Conference
Single event transients in combinatorial circuits
SBCCI '05 Proceedings of the 18th annual symposium on Integrated circuits and system design
Recursive TMR: Scaling Fault Tolerance in the Nanoscale Era
IEEE Design & Test
Deployment of Better Than Worst-Case Design: Solutions and Needs
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
A soft error rate analysis (SERA) methodology
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Soft delay error analysis in logic circuits
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Vulnerability analysis of L2 cache elements to single event upsets
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Single event transients in dynamic logic
SBCCI '06 Proceedings of the 19th annual symposium on Integrated circuits and systems design
Reducing Data Cache Susceptibility to Soft Errors
IEEE Transactions on Dependable and Secure Computing
Architecting a reliable CMP switch architecture
ACM Transactions on Architecture and Code Optimization (TACO)
SEU mitigation for sram-based fpgas through dynamic partial reconfiguration
Proceedings of the 17th ACM Great Lakes symposium on VLSI
Proceedings of the 17th ACM Great Lakes symposium on VLSI
Dynamic prediction of architectural vulnerability from microarchitectural state
Proceedings of the 34th annual international symposium on Computer architecture
Modeling and improving data cache reliability: 1
Proceedings of the 2007 ACM SIGMETRICS international conference on Measurement and modeling of computer systems
JVM susceptibility to memory errors
JVM'01 Proceedings of the 2001 Symposium on JavaTM Virtual Machine Research and Technology Symposium - Volume 1
The visual vulnerability spectrum: characterizing architectural vulnerability for graphics hardware
GH '06 Proceedings of the 21st ACM SIGGRAPH/EUROGRAPHICS symposium on Graphics hardware
Software and Hardware Techniques for SEU Detection in IP Processors
Journal of Electronic Testing: Theory and Applications
A memory soft error measurement on production systems
ATC'07 2007 USENIX Annual Technical Conference on Proceedings of the USENIX Annual Technical Conference
Efficient fault tolerance in multi-media applications through selective instruction replication
Proceedings of the 2008 workshop on Radiation effects and fault tolerance in nanometer technologies
SEMM-2: a new generation of single-event-effect modeling tools
IBM Journal of Research and Development
Single-event-upset and alpha-particle emission rate measurement techniques
IBM Journal of Research and Development
Self-Organization for Fault-Tolerance
IWSOS '08 Proceedings of the 3rd International Workshop on Self-Organizing Systems
Integration, the VLSI Journal
Proceedings of the 3rd International Conference on Bio-Inspired Models of Network, Information and Computing Sytems
Multi-level fault modeling for transaction-level specifications
Proceedings of the 19th ACM Great Lakes symposium on VLSI
Architecture Design for Soft Errors
Architecture Design for Soft Errors
Proceedings of the 46th Annual Design Automation Conference
Use ECP, not ECC, for hard failures in resistive memories
Proceedings of the 37th annual international symposium on Computer architecture
Modeling soft errors for data caches and alleviating their effects on data reliability
Microprocessors & Microsystems
Hard Data on Soft Errors: A Large-Scale Assessment of Real-World Error Rates in GPGPU
CCGRID '10 Proceedings of the 2010 10th IEEE/ACM International Conference on Cluster, Cloud and Grid Computing
A realistic evaluation of memory hardware errors and software system susceptibility
USENIXATC'10 Proceedings of the 2010 USENIX conference on USENIX annual technical conference
Design as you see FIT: system-level soft error analysis of sequential circuits
Proceedings of the Conference on Design, Automation and Test in Europe
Radiation-induced Soft Errors: A Chip-level Modeling Perspective
Foundations and Trends in Electronic Design Automation
Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on the 2002 international symposium on low-power electronics and design (ISLPED)
Characterizing the impact of soft errors on iterative methods in scientific computing
Proceedings of the international conference on Supercomputing
Performance implications of failures in large-scale cluster scheduling
JSSPP'04 Proceedings of the 10th international conference on Job Scheduling Strategies for Parallel Processing
Low-power multiple-bit upset tolerant memory optimization
Proceedings of the International Conference on Computer-Aided Design
ASPLOS XVII Proceedings of the seventeenth international conference on Architectural Support for Programming Languages and Operating Systems
Memory space conscious loop iteration duplication for reliable execution
SAS'05 Proceedings of the 12th international conference on Static Analysis
Hi-index | 0.00 |