Recursive TMR: Scaling Fault Tolerance in the Nanoscale Era

Authors:
Darshan D. Thaker;Francois Impens;Isaac L. Chuang;Rajeevan Amirtharajah;Frederic T. Chong
Affiliations:
University of California, Davis;Massachusetts Institute of Technology;Massachusetts Institute of Technology;University of California, Davis;University of California, Santa Barbara
Venue:
IEEE Design & Test
Year:
2005

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Abstract

Although recursive voting leads to a double exponential decrease in a circuit's failure probability, a single error in the last majority gate can cause an incorrect result, hampering the technique's effectiveness. Combining recursive majority voting and multiplexing helps alleviate this problem. However, the cost of this fault-tolerant approach might not be worthwhile, depending on the nature of the faults.