IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Modeling the cosmic-ray-induced soft-error rate in integrated circuits: an overview
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Soft-error Monte Carlo modeling program, SEMM
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Accelerated testing for cosmic soft-error rate
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Modeling the cosmic-ray-induced soft-error rate in integrated circuits: an overview
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Soft-error Monte Carlo modeling program, SEMM
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Proceedings of the 41st annual Design Automation Conference
Gate-Level Mitigation Techniques for Neutron-Induced Soft Error Rate
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Soft-Spot Analysis: Targeting Compound Noise Effects in Nanometer Circuits
IEEE Design & Test
A soft error rate analysis (SERA) methodology
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Logic SER Reduction through Flipflop Redesign
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
An efficient static algorithm for computing the soft error rates of combinational circuits
Proceedings of the conference on Design, automation and test in Europe: Proceedings
A family of cells to reduce the soft-error-rate in ternary-CAM
Proceedings of the 43rd annual Design Automation Conference
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Soft error reduction in combinational logic using gate resizing and flipflop selection
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
SEU-Hardened Energy Recovery Pipelined Interconnects for On-Chip Networks
NOCS '08 Proceedings of the Second ACM/IEEE International Symposium on Networks-on-Chip
Guiding circuit level fault-tolerance design with statistical methods
Proceedings of the conference on Design, automation and test in Europe
Case study of reliability-aware and low-power design
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Architecture Design for Soft Errors
Architecture Design for Soft Errors
Circuit optimization techniques to mitigate the effects of soft errors in combinational logic
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Selective replication: A lightweight technique for soft errors
ACM Transactions on Computer Systems (TOCS)
False Error Vulnerability Study of On-line Soft Error Detection Mechanisms
Journal of Electronic Testing: Theory and Applications
Soft error modeling and remediation techniques in ASIC designs
Microelectronics Journal
Design as you see FIT: system-level soft error analysis of sequential circuits
Proceedings of the Conference on Design, Automation and Test in Europe
Radiation-induced Soft Errors: A Chip-level Modeling Perspective
Foundations and Trends in Electronic Design Automation
Analysis and optimization of nanometer CMOS circuits for soft-error tolerance
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Low-power multiple-bit upset tolerant memory optimization
Proceedings of the International Conference on Computer-Aided Design
Single event crosstalk prediction in nanometer technologies
Analog Integrated Circuits and Signal Processing
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