Introduction to algorithms
Critical charge calculations for a bipolar SRAM array
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Digital integrated circuits: a design perspective
Digital integrated circuits: a design perspective
Proof verification and the hardness of approximation problems
Journal of the ACM (JACM)
Cost reduction and evaluation of temporary faults detecting technique
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Improved crosstalk modeling for noise constrained interconnect optimization
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
Challenges in power-ground integrity
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
Comprehensive frequency-dependent substrate noise analysis using boundary element methods
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Noise-Aware Driver Modeling for Nanometer Technology
ISQED '03 Proceedings of the 4th International Symposium on Quality Electronic Design
Circuit-level design approaches for radiation-hard digital electronics
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Soft-spot analysis identifies regions in a circuit that are most susceptible to multiple noise sources and their compound effects so that designers can harden those spots for greater robustness. HSpice simulation validates the methodology's quality, and demonstration on a commercial embedded processor shows its scalability.