IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Portable Faraday cup for nonvacuum proton beams
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Modeling the cosmic-ray-induced soft-error rate in integrated circuits: an overview
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Critical charge calculations for a bipolar SRAM array
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
IBM experiments in soft fails in computer electronics (1978–1994)
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Field testing for cosmic ray soft errors in semiconductor memories
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Portable Faraday cup for nonvacuum proton beams
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Modeling the cosmic-ray-induced soft-error rate in integrated circuits: an overview
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Efficiently supporting fault-tolerance in FPGAs
FPGA '98 Proceedings of the 1998 ACM/SIGDA sixth international symposium on Field programmable gate arrays
Fingerprinting: bounding soft-error detection latency and bandwidth
ASPLOS XI Proceedings of the 11th international conference on Architectural support for programming languages and operating systems
A memory soft error measurement on production systems
ATC'07 2007 USENIX Annual Technical Conference on Proceedings of the USENIX Annual Technical Conference
Analytical techniques for soft error rate modeling and mitigation of FPGA-based designs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Improving cache lifetime reliability at ultra-low voltages
Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture
A realistic evaluation of memory hardware errors and software system susceptibility
USENIXATC'10 Proceedings of the 2010 USENIX conference on USENIX annual technical conference
Review: A survey of memory error correcting techniques for improved reliability
Journal of Network and Computer Applications
A column parity based fault detection mechanism for FIFO buffers
Integration, the VLSI Journal
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