Soft-error Monte Carlo modeling program, SEMM

Field testing for cosmic ray soft errors in semiconductor memories

IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors

Modeling the cosmic-ray-induced soft-error rate in integrated circuits: an overview

IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors

Nuclear physics of cosmic ray interaction with semiconductor materials: particle-induced soft errors from a physicist's perspective

IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors

Critical charge calculations for a bipolar SRAM array

IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors

Soft Delay Error Effects in CMOS Combinational Circuits

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium

Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes

IEEE Transactions on Dependable and Secure Computing

An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories

Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

A soft error rate analysis (SERA) methodology

Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design

FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs

ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design

Self-Stabilizing Microprocessor: Analyzing and Overcoming Soft Errors

IEEE Transactions on Computers

An efficient static algorithm for computing the soft error rates of combinational circuits

Proceedings of the conference on Design, automation and test in Europe: Proceedings

Interactive presentation: A new asymmetric SRAM cell to reduce soft errors and leakage power in FPGA

Proceedings of the conference on Design, automation and test in Europe

Alpha-particle-induced upsets in advanced CMOS circuits and technology

IBM Journal of Research and Development

SEMM-2: a new generation of single-event-effect modeling tools

IBM Journal of Research and Development

New simulation methodology for effects of radiation in semiconductor chip structures

IBM Journal of Research and Development

Circuit design and modeling for soft errors

IBM Journal of Research and Development

Single-event-upset and alpha-particle emission rate measurement techniques

IBM Journal of Research and Development

SRAM dynamic stability: theory, variability and analysis

Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design

Architecture Design for Soft Errors

Architecture Design for Soft Errors

Soft error optimization of standard cell circuits based on gate sizing and multi-objective genetic algorithm

Proceedings of the 46th Annual Design Automation Conference

Radiation-induced Soft Errors: A Chip-level Modeling Perspective

Foundations and Trends in Electronic Design Automation

Low-power multiple-bit upset tolerant memory optimization

Proceedings of the International Conference on Computer-Aided Design

CARROT: a tool for fast and accurate soft error rate estimation

SAMOS'06 Proceedings of the 6th international conference on Embedded Computer Systems: architectures, Modeling, and Simulation

A Practical Approach to Single Event Transient Analysis for Highly Complex Design

Journal of Electronic Testing: Theory and Applications