Alpha-particle-induced upsets in advanced CMOS circuits and technology

Authors:
D. F. Heidel;K. P. Rodbell;E. H. Cannon;C. Cabral, Jr.;M. S. Gordon;P. Oldiges;H. H. K. Tang
Affiliations:
IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York;IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York;IBM Systems and Technology Group, Essex Junction, Vermont;IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York;IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York;IBM Semiconductor Research and Development Center, Systems and Technology Group, Hopewell Junction, New York;IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York
Venue:
IBM Journal of Research and Development
Year:
2008

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Abstract

In this paper, we review the current status of single-event upsets caused by alpha-particles in IBM circuits and technology. While both alpha-particles and cosmic radiation can induce upsets, the alpha-particle-induced upset rate has become an increasingly important issue because alpha-particle-induced upsets are no longer limited to memory circuits. Latch circuits have become highly sensitive to alpha-particles. The alpha-particle-induced upset rate of latch circuits is one of the most critical issues for microprocessors requiring both high performance and high reliability.