Interactive presentation: A new asymmetric SRAM cell to reduce soft errors and leakage power in FPGA

Authors:
Balkaran S. Gill;Chris Papachristou;Francis G. Wolff
Affiliations:
Case Western Reserve University, Cleveland, Ohio;Case Western Reserve University, Cleveland, Ohio;Case Western Reserve University, Cleveland, Ohio
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
2007

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Abstract

Soft errors in semiconductor memories occur due to charged particle strikes at the cell nodes. In this paper, we present a new asymmetric memory cell to increase the soft error tolerance of SRAM. At the same time, this cell can be used at the reduced supply voltage to decrease the leakage power without significantly increasing the soft error rate of SRAM. A major use of this cell is in the configuration memory of FPGA. The cell is designed using a 70nm process technology and verified using Spice simulations. Soft error tolerance results are presented and compared with standard SRAM cell and an existing increased soft error tolerance cell. Simulation results show that our cell has lowest soft error rate at the various supply voltages.