IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Soft-error Monte Carlo modeling program, SEMM
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Genetic algorithms + data structures = evolution programs (3rd ed.)
Genetic algorithms + data structures = evolution programs (3rd ed.)
Efficient logic-level timing analysis using constraint-guided critical path search
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special issue on the 1995 IEEE ASIC conference
Comparison of Physical and Software-Implemented Fault Injection Techniques
IEEE Transactions on Computers
Early SEU Fault Injection in Digital, Analog and Mixed Signal Circuits: A Global Flow
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes
IEEE Transactions on Dependable and Secure Computing
A design approach for radiation-hard digital electronics
Proceedings of the 43rd annual Design Automation Conference
The Definitive ANTLR Reference: Building Domain-Specific Languages
The Definitive ANTLR Reference: Building Domain-Specific Languages
Enhancement of fault injection techniques based on the modification of VHDL code
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
SEMM-2: a new generation of single-event-effect modeling tools
IBM Journal of Research and Development
Analysis and optimization of nanometer CMOS circuits for soft-error tolerance
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A fast and elitist multiobjective genetic algorithm: NSGA-II
IEEE Transactions on Evolutionary Computation
Gate sizing to radiation harden combinational logic
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Soft-Error-Rate-Analysis (SERA) Methodology
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Circuit Reliability Analysis Using Symbolic Techniques
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Computing the Soft Error Rate of a Combinational Logic Circuit Using Parameterized Descriptors
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Modeling and Optimization for Soft-Error Reliability of Sequential Circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Design of robust metabolic pathways
Proceedings of the 48th Design Automation Conference
Proceedings of the Ninth IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis
| Hi-index | 0.00 |
A radiation harden technique based on gate sizing and multi-objective genetic algorithm (MOGA) is developed to optimize the soft error tolerance of standard cell circuits. Soft error rate (SER), chip area and longest path delay are selected as the optimization goals and fast fitness evaluation algorithms for the three goals are developed and embedded into the MOGA. All the three goals are optimized simultaneously by optimally sizing the gates in the circuit, which is a complex NP-Complete problem and resolved by MOGA through exploring the global design space of the circuit. Syntax analysis technique is also employed to make the proposed framework can optimize not only pure combinational logic circuit but also the combinational parts of sequential logic circuit. Optimizing experiments carried out on ISCAS'85 and ISCAS'89 standard benchmark circuits show that the proposed optimization algorithm can decrease the SER 74.25% with very limited delay overhead (0.28%). Furthermore, the algorithm can also reduce the area for most of the circuit under test by average 5.23%. The proposed technique is proved to be better than other works in delay and area overhead and suitable to direct the design of soft error tolerance integrated circuits in high reliability realms.