Soft-error Monte Carlo modeling program, SEMM
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs
DFT '02 Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Static Analysis of SEU Effects on Software Applications
ITC '02 Proceedings of the 2002 IEEE International Test Conference
An Accurate SER Estimation Method Based on Propagation Probability
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
A Systematical Method of Quantifying SEU FIT
IOLTS '08 Proceedings of the 2008 14th IEEE International On-Line Testing Symposium
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Single Event Transients are considerably more difficult to model, simulate and analyze than the closely-related Single Event Upsets. The work environment may cause a myriad of distinctive transient pulses in various cell types that are used in widely different configurations. We present practical methods to help characterizing the standard cell library using dedicated tools and results from radiation testing. Furthermore, we analyze the SET propagation in logic networks using a standard (reference) serial fault simulation approach and an accelerated fault simulation technique, taking in account both logic and temporal considerations. The accelerated method provides similar results as the reference approach while offering a considerable increase in the simulation speed. However, the simulation approach may not be feasible for large (multi-million cells) designs that could benefit from static analysis methods. We benchmark the results of a static, probabilistic approach against the reference and accelerated methods. Finally, we discuss the integration of the SET analysis in a complete Soft Error Rate analysis flow.