IBM experiments in soft fails in computer electronics (1978–1994)
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Modeling the cosmic-ray-induced soft-error rate in integrated circuits: an overview
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Soft-error Monte Carlo modeling program, SEMM
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Field testing for cosmic ray soft errors in semiconductor memories
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Modeling the cosmic-ray-induced soft-error rate in integrated circuits: an overview
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Soft-error Monte Carlo modeling program, SEMM
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
Latch Susceptibility to Transient Faults and New Hardening Approach
IEEE Transactions on Computers
SEMM-2: a new generation of single-event-effect modeling tools
IBM Journal of Research and Development
New simulation methodology for effects of radiation in semiconductor chip structures
IBM Journal of Research and Development
Circuit design and modeling for soft errors
IBM Journal of Research and Development
Architecture Design for Soft Errors
Architecture Design for Soft Errors
Radiation-induced Soft Errors: A Chip-level Modeling Perspective
Foundations and Trends in Electronic Design Automation
| Hi-index | 0.00 |