Soft-error Monte Carlo modeling program, SEMM
IBM Journal of Research and Development - Special issue: terrestrial cosmic rays and soft errors
A Gate-Level Simulation Environment for Alpha-Particle-Induced Transient Faults
IEEE Transactions on Computers
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Proceedings of the 41st annual Design Automation Conference
Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
A soft error rate analysis (SERA) methodology
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Hi-index | 0.00 |
We present a soft error rate (SER) analysis methodology within a simulation and design environment that covers a broad spectrum of design problems and parameters. Our approach includes modeling of the particle hit at the transistor level, fast Monte-Carlo type simulation to obtain the latching probability of a particle hit on all nodes of the circuit, embedded timing analysis to obtain the latching window, and fine-grained accounting of the electrical masking effects to account for both the effects of scaling and of pulse duration versus the period of the system clock to get an estimate of the maximum SER of the circuit. This approach has been implemented in CARROT and placed under a broad design environment to assess design tradeoffs with SER as a parameter.