Using Bulk Built-in Current Sensors to Detect Soft Errors

Authors:
Egas Henes Neto;Ivandro Ribeiro;Michele Vieira;Gilson Wirth;Fernanda Lima Kastensmidt
Affiliations:
Universidade Estadual do Rio Grande do Sul;Universidade Estadual do Rio Grande do Sul;Universidade Estadual do Rio Grande do Sul;Universidade Estadual do Rio Grande do Sul;Universidade Federal do Rio Grande do Sul
Venue:
IEEE Micro
Year:
2006

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Abstract

Connecting a built-in current sensor in the design bulk of a digital system increases sensitivity for detecting transient upsets in combinational and sequential logic. SPICE simulations validate this approach and show only minor penalties in terms of area, performance, and power consumption.