Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic
DSN '02 Proceedings of the 2002 International Conference on Dependable Systems and Networks
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Soft errors can be efficiently detected using built in current sensors connected to the transistors bulk, monitoring currents caused by ionizations in the substrate. However, electrical parameter variations can compromise the functional operation of the sensor. The electrical parameter variations can arise from variations during the fabrication process of nanometer scale technologies, as well as from exposure to radiation. This work presents a parameterized current sensor (Tbulk-BICS), which is based on trimming bits. The Tbulk-BICS is able to compensate electrical parameter variations by digitally adjusting the transconductance. Electrical simulation results show the high detection efficiency of the Tbulk-BICS, even in presence of process and temperature variations.