Exploring the Limitations of Software-based Techniques in SEE Fault Coverage

Authors:
José Rodrigo Azambuja;Samuel Pagliarini;Lucas Rosa;Fernanda Lima Kastensmidt
Affiliations:
Instituto de Informática--PPGC--PGMICRO, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil;Instituto de Informática--PPGC--PGMICRO, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil;Instituto de Informática--PPGC--PGMICRO, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil;Instituto de Informática--PPGC--PGMICRO, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2011

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Journal of Electronic Testing: Theory and Applications

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Abstract

This paper presents a detailed analysis of the efficiency of software-based techniques to mitigate SEU and SET in microprocessors. A set of well-known rules is presented and implemented automatically to transform an unprotected program into a hardened one. SEU and SET are injected in all sensitive areas of a MIPS-based microprocessor architecture. The efficiency of each rule and a combination of them are tested. Experimental results show the limitations of the control-flow techniques in detecting the majority of SEU and SET faults, even when different basic block sizes are evaluated. A further analysis on the undetected faults with control flow effect is done and five causes are explained. The conclusions may lead designers into developing more efficient techniques to detect these types of faults.