Design & analysis of fault tolerant digital systems
Design & analysis of fault tolerant digital systems
Cost reduction and evaluation of temporary faults detecting technique
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Designing fault tolerant systems into SRAM-based FPGAs
Proceedings of the 40th annual Design Automation Conference
Evaluation of a Soft Error Tolerance Technique Based on Time and/or Space Redundancy
SBCCI '00 Proceedings of the 13th symposium on Integrated circuits and systems design
CACO-PS: A General Purpose Cycle-Accurate Configurable Power Simulator
SBCCI '03 Proceedings of the 16th symposium on Integrated circuits and systems design
Defect and Error Tolerance in the Presence of Massive Numbers of Defects
IEEE Design & Test
An Intrinsically Robust Technique for Fault Tolerance under Multiple Upsets
IOLTS '04 Proceedings of the International On-Line Testing Symposium, 10th IEEE
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
Arithmetic Operators Robust to Multiple Simultaneous Upsets
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
Using majority logic to cope with long duration transient faults
Proceedings of the 20th annual conference on Integrated circuits and systems design
Majority Logic Mapping for Soft Error Dependability
Journal of Electronic Testing: Theory and Applications
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Future technologies will present devices so small that they will be heavily influenced by electromagnetic noise and SEU induced errors. Since many soft errors might appear at the same time, classical fault tolerance techniques, such as TMR, will no longer provide reliable protection and will make new design approaches necessary. This study shows that the TMR approach has intrinsic weaknesses that impair its effectiveness in the presence of multiple faults, and proposes a new technique that provides better protection than TMR for single as well as multiple faults. The proposed technique is based on the use of some analog components among the digital circuits. We present results based on a multiplier, and show that the technique is scalable to withstand higher quantities of simultaneous faults.