Early Evaluation Of Bus Interconnects Dependability For System-On-Chip Designs
VLSID '01 Proceedings of the The 14th International Conference on VLSI Design (VLSID '01)
A fault model notation and error-control scheme for switch-to-switch buses in a network-on-chip
Proceedings of the 1st IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
Analysis of Error Recovery Schemes for Networks on Chips
IEEE Design & Test
Coding for system-on-chip networks: a unified framework
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Error control schemes for on-chip communication links: the energy-reliability tradeoff
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
On hamming product codes with type-II hybrid ARQ for on-chip interconnects
IEEE Transactions on Circuits and Systems Part I: Regular Papers
Self-adaptive system for addressing permanent errors in on-chip interconnects
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Dual-layer adaptive error control for network-on-chip links
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Methods for fault tolerance in networks-on-chip
ACM Computing Surveys (CSUR)
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The amount of errors in future nanoscale technologies is expected to increase dramatically when compared to technologies that have line width larger than 90 nm. In nanoscale CMOS circuits fault tolerance is one of the most important design constraints to sustain system reliability at an acceptable level. We analyze different error correcting coding methods for on-chip communication networks of future nanoscale multiprocessor systems. The implemented communication circuits are compared in terms of error correction capability, circuit area and power consumption. In addition, performance of implemented systems is evaluated under different error scenarios by taking into account variable number of single bit errors, burst errors, and their combinations.