Self-adaptive system for addressing permanent errors in on-chip interconnects

  • Authors:
  • Teijo Lehtonen;David Wolpert;Pasi Liljeberg;Juha Plosila;Paul Ampadu

  • Affiliations:
  • Turku Centre for Computer Science, Turku, Finland and Department of Information Technology, University of Turku, Turku, Finland;Embedded Integrated Systems-on-Chip Research Group, Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY;Department of Information Technology, University of Turku, Turku, Finland;Research Council for Natural Sciences and Engineering, Academy of Finland, Helsinki, Finland and Department of Information Technology, University of Turku, Turku, Finland;Embedded Integrated Systems-on-Chip Research Group, Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY

  • Venue:
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • Year:
  • 2010

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Abstract

We present a self-contained adaptive system for detecting and bypassing permanent errors in on-chip interconnects. The proposed system reroutes data on erroneous links to a set of spare wires without interrupting the data flow. To detect permanent errors at runtime, a novel in-line test (ILT) method using spare wires and a test pattern generator is proposed. In addition, an improved syndrome storing-based detection (SSD) method is presented and compared to the ILT method. Each detection method (ILT and SSD) is integrated individually into the noninterrupting adaptive system, and a case study is performed to compare them with Hamming and Bose-Chaudhuri-Hocquenghem (BCH) code implementations. In the presence of permanent errors, the probability of correct transmission in the proposed systems is improved by up to 140% over the standalone Hamming code. Furthermore, our methods achieve up to 38% area, 64% energy, and 61% latency improvements over the BCH implementation at comparable error performance.