At-speed boundary-scan interconnect testing in a board with multiple system clocks

Authors:
Jongchul Shin;Hyunjin Kim;Sungho Kang
Affiliations:
Computer Systems Laboratory, Yonsei University, Republic of Korea;Computer Systems Laboratory, Yonsei University, Republic of Korea;Computer Systems Laboratory, Yonsei University, Republic of Korea
Venue:
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Year:
1999

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