Intermittent faults and effects on reliability of integrated circuits

Authors:
Cristian Constantinescu
Affiliations:
Advanced Micro Devices, USA
Venue:
RAMS '08 Proceedings of the 2008 Annual Reliability and Maintainability Symposium
Year:
2008

Citing 0
Cited 2

IVF: characterizing the vulnerability of microprocessor structures to intermittent faults

Proceedings of the Conference on Design, Automation and Test in Europe
IVF: characterizing the vulnerability of microprocessor structures to intermittent faults

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Quantified Score

Hi-index	0.00

Visualization

Abstract

In the design of fatigue sensitive components, attention is often focused on defining a representative load spectrum that can be used with the fatigue properties of the material to assess the relative merits of a particular design. In practice, these ...