Buffer Insertion Considering Process Variation

  • Authors:
  • Jinjun Xiong;Kingho Tam;Lei He

  • Affiliations:
  • University of California at Los Angeles;University of California at Los Angeles;University of California at Los Angeles

  • Venue:
  • Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
  • Year:
  • 2005

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Abstract

A comprehensive probabilistic methodology is proposed to solve the buffer insertion problem with the consideration of process variations. In contrast to a recent work, we point out, for the first time, that the correlation between the required arrival time and the downstream loading capacitance must be considered in order to solve the problem "correctly". We develop an efficient bottom-up recursive algorithm to calculate the joint probability density function that accurately captures the above correlation, and propose effective pruning rules to exclude probabilistically inferior solutions. We verify our buffer insertion using timing analysis with both device andinterconnect variations, and show that compared to the conventional buffer insertion algorithm using nominal device and interconnect parameters, our new buffer insertion methodology can reduce the probability of timing violation by up to 30%.