Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Leakage aware dynamic voltage scaling for real-time embedded systems
Proceedings of the 41st annual Design Automation Conference
Proceedings of the 42nd annual Design Automation Conference
Design of a wireless sensor network platform for detecting rare, random, and ephemeral events
IPSN '05 Proceedings of the 4th international symposium on Information processing in sensor networks
High-performance CMOS variability in the 65-nm regime and beyond
IBM Journal of Research and Development - Advanced silicon technology
Thermal-aware task scheduling at the system software level
ISLPED '07 Proceedings of the 2007 international symposium on Low power electronics and design
On the impact of manufacturing process variations on the lifetime of sensor networks
CODES+ISSS '07 Proceedings of the 5th IEEE/ACM international conference on Hardware/software codesign and system synthesis
Software-assisted hardware reliability: abstracting circuit-level challenges to the software stack
Proceedings of the 46th Annual Design Automation Conference
Software adaptation in quality sensitive applications to deal with hardware variability
Proceedings of the 20th symposium on Great lakes symposium on VLSI
Emerging techniques for long lived wireless sensor networks
IEEE Communications Magazine
ViPZonE: OS-level memory variability-driven physical address zoning for energy savings
Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
Online device-level energy accounting for wireless sensor nodes
EWSN'13 Proceedings of the 10th European conference on Wireless Sensor Networks
AppAdapt: opportunistic application adaptation in presence of hardware variation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
VaMV: variability-aware memory virtualization
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Embedded RAIDs-on-chip for bus-based chip-multiprocessors
ACM Transactions on Embedded Computing Systems (TECS)
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The system lifetime gains provided by the various power management techniques in embedded sensing systems are a strong function of the active and sleep mode power consumption of the underlying hardware platform. However, power consumption characteristics of hardware platforms exhibit high variability across different instances of the platform, diverse ambient conditions, and over passage of time. The factors underlying this variability include increased manufacturing variations and aging effects due to shrinking transistor geometries, and deployment of embedded devices in extreme environments. Our experimental measurements show that large variability in sleep mode power is already present in commonly used embedded processors, and technology trends suggest that the variability will grow even more over time and affect active mode power as well. Such variability results in suboptimal lifetime and service quality. We therefore argue for energy management approaches that learn and model the power characteristics of the specific instance of the hardware platform, and adapt accordingly.